http://www.ics.ee.nctu.edu.tw/~mdker/International%20Conference%20Papers/2002-ESD%20PROTECTION%20CIRCUITS%20WITH%20NOVEL%20MOS-BOUNDED%20DIODE%20STRUCTURES.pdf WebSep 1, 2016 · An electrostatic discharge (ESD) strengthening design of high-voltage (HV) n -channel laterally diffused metal–oxide semiconductor (nLDMOS) transistors combined with embedded-SCR anode islands is investigated.
Silicon-Controlled Rectifier Stacking Structure for High-Voltage …
WebMay 3, 2012 · FINFET compatible PC-bounded ESD diode May 3, 2012 - GlobalFoundries Inc. A semiconductor device is formed having compatibility with FINFET process flow, while having a large enough junction area of to reduce the discharge ESD current density. WebJul 1, 2024 · The source-gate diode in the DMP3007 you reference is purely for protection from electrostatic discharge (ESD): This paper from Infineon implies that gate ESD protection is mostly intended to prevent … doj scoping
FINFET compatible PC-bounded ESD diode - patents.justia.com
WebJul 1, 2007 · This technique offers an alternative to the classical gate bounded diode and will later be used in the derivation of the proposed SOI-SCR lay-out. Table 1 shows that SOI devices have a significantly higher on resistance due to the thin Si-film. Note also the increased sheet resistance of SOI diodes due to the decreased film thickness in 65 nm … WebJun 28, 2010 · Gate bounded diode triggered high holding voltage SCR ESD clamp for high voltage application is proposed in this paper. A straight-forward gate bounded diode for low triggering voltage can be… Expand 11 View 1 excerpt, cites background Stacking Switch to Achieve Low-Trigger and High-Holding-Voltage-Clamp Characteristics WebSep 12, 2013 · The gate dependence of the present diode behavior enables gate-tunable rectifier circuits (Fig. 2D), which is a unique feature of the s-SWCNT/SL-MoS 2 … doj scan